英语语法分析

The measuring condition for principle Angle in spectroscopic ellipsometry is analyzed.

对椭圆偏振光谱中的主角测量条件进行了分析。

Accurate measurement of its retardation by ellipsometry prove the rationality of its structure design.

椭偏术对其相延测量的实验结果，验证了这种波片结构设计的合理性。

The structure of the laser crystallized poly-Si thin film is analyzed by using spectroscopic ellipsometry.

采用椭偏光谱法分析了薄膜的结构，并提出多层膜模型模拟薄膜结构。